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1

Virus elimination by meristem-tip culture from a range of Alstroemeria cultivars

F. A. Hakkaart, Joke M. A. Versluijs

Journal:

European Journal of Plant Pathology

Year:

1988

Language:

english

File:

PDF, 919 KB

english, 1988

2

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 12 February 2012)] Optical Microlithography XXV - Process development using negative tone development for the dark field critical layers in a 28nm node process

Versluijs, Janko, Truffert, Vincent, Murdoch, Gayle, De Bisschop, Peter, Trivkovic, Darko, Wiaux, Vincent, Kunnen, Eddy, Souriau, Laurent, Demuynck, Steven, Ercken, Monique, Conley, Will

Year:

2012

Language:

english

File:

PDF, 18.93 MB

english, 2012

3

Fabrication and characterisation of Ni nanocontacts

O. Céspedes, M.A. Bari, C. Dennis, J.J. Versluijs, G. Jan, J. O’Sullivan, J.F. Gregg, J.M.D. Coey

Journal:

Journal of Magnetism and Magnetic Materials

Year:

2002

Language:

english

File:

PDF, 193 KB

english, 2002

4

The influence of cetomacrogol ointment processing on structure: A definitive screening design

van Heugten, A.J.P., Braal, C.L., Versluijs-Helder, M., Vromans, H.

Journal:

European Journal of Pharmaceutical Sciences

Year:

2017

Language:

english

File:

PDF, 1.40 MB

english, 2017

5

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Optical Microlithography XX - Manufacturability issues with double patterning for 50-nm half-pitch single damascene applications using RELACS shrink and corresponding OPC

Op de Beeck, Maaike, Flagello, Donis G., Versluijs, Janko, Wiaux, Vincent, Vandeweyer, Tom, Ciofi, Ivan, Struyf, Herbert, Hendrickx, Dirk, Van Olmen, Jan

Year:

2007

Language:

english

File:

PDF, 1.64 MB

english, 2007

6

SPIE Proceedings [SPIE Microlithography 2005 - San Jose, CA (Sunday 27 February 2005)] Optical Microlithography XVIII - Double patterning scheme for sub-0.25 k1 single damascene structures at NA=0.75, λ=193nm

Maenhoudt, M., Smith, Bruce W., Versluijs, J., Struyf, H., Van Olmen, J., Van Hove, M.

Year:

2005

Language:

english

File:

PDF, 610 KB

english, 2005

7

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Advances in Patterning Materials and Processes XXXIII - Analyzing block placement errors in SADP patterning

Hohle, Christoph K., Younkin, Todd R., Kobayashi, Shinji, Okada, Soichiro, Shimura, Satoru, Nafus, Kathleen, Fonseca, Carlos, Demand, Marc, Biesemans, Serge, Versluijs, Janko, Ercken, Monique, Foubert

Year:

2016

Language:

english

File:

PDF, 1.56 MB

english, 2016

8

Magnetoresistance of Half-Metallic Oxide Nanocontacts

Versluijs, J. J., Bari, M. A., Coey, J. M. D.

Journal:

Physical Review Letters

Year:

2001

Language:

english

File:

PDF, 119 KB

english, 2001

9

[IEEE 2009 IEEE International Interconnect Technology Conference - IITC - Sapporo, Japan (2009.06.1-2009.06.3)] 2009 IEEE International Interconnect Technology Conference - Impact of LER on BEOL dielectric reliability: A quantitative model and experimental validation

Tokei, Zs., Roussel, Ph., Stucchi, M., Versluijs, J., Ciofi, I., Carbonell, L., Beyer, G.P., Cockburn, A., Agustin, M., Shah, K.

Year:

2009

Language:

english

File:

PDF, 262 KB

english, 2009

10

Soil–plant transfer models for metals to improve soil screening value guidelines valid for São Paulo, Brazil

dos Santos-Araujo, Sabrina N., Swartjes, Frank A., Versluijs, Kees W., Moreno, Fabio Netto, Alleoni, Luís R. F.

Journal:

Environmental Monitoring and Assessment

Year:

2017

Language:

english

File:

PDF, 2.20 MB

english, 2017

11

[IEEE 2018 IEEE International Interconnect Technology Conference (IITC) - Santa Clara, CA, USA (2018.6.4-2018.6.7)] 2018 IEEE International Interconnect Technology Conference (IITC) - Replacement Metal Contact Using Sacrificial ILD0 for Wrap Around Contact in Scaled FinFET Technology

Chew, S-A., Demuynck, S., Zhang, L., Pacco, A., Devriendt, K., Teugels, L., Hopf, T., Versluijs, J., Vrancken, C., Dangol, A., Altamirano Sanchez, E., Mocuta, D., Horiguchi, N.

Year:

2018

Language:

english

File:

PDF, 2.01 MB

english, 2018

12

Non-linear I–V curves in nanocontacts between crystals of (La0.7Sr0.3)MnO3

J.J Versluijs, M Bari, F Ott, J.M.D Coey, A Revcolevschi

Journal:

Journal of Magnetism and Magnetic Materials

Year:

2000

Language:

english

File:

PDF, 159 KB

english, 2000

13

[IEEE Proceedings of the IEEE 2006 International Interconnect Technology Conference - Burlingame, CA (2006.06.5-2006.06.7)] 2006 International Interconnect Technology Conference - Low-k properties and integration processes enabling reliable interconnect scaling to the 32 nm technology node

Ikeda, A., Travaly, Y., Humbert, A., Hoofman, R.J.O.M., Li, Y.L., Tokei, Zs., Iacopi, F., Michelon, J., Bruynseraede, C., Willegems, M., Hendrickx, D., Van Aelst, J., Struyf, H., Versluijs, J., Heylen

Year:

2006

Language:

english

File:

PDF, 413 KB

english, 2006

14

[IEEE 2011 Materials for Advanced Metallization (MAM) - Dresden, Germany (2011.05.8-2011.05.12)] 2011 IEEE International Interconnect Technology Conference - Line Edge Roughness (LER) correlation and dielectric reliability with Spacer-Defined Double Patterning (SDDP) at 20nm half pitch

Siew, Yong Kong, Stucchi, Michele, Versluijs, Janko, Roussel, Philippe, Kunnen, Eddy, Pantouvaki, Marianna, Beyer, Gerald P., Tokei, Zsolt

Year:

2011

Language:

english

File:

PDF, 387 KB

english, 2011

15

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2013)] Advanced Etch Technology for Nanopatterning II - 15nm HP patterning with EUV and SADP: key contributors for improvement of LWR, LER, and CDU

Xu, K., Souriau, L., Hellin, D., Versluijs, J., Wong, P., Vangoidsenhoven, D., Vandenbroeck, N., Dekkers, H., Shi, X. P., Albert, J., Tan, C. L., Vertommen, J., Coenegrachts, B., Orain, I., Kimura, Y.

Year:

2013

Language:

english

File:

PDF, 1.93 MB

english, 2013

16

[IEEE 2010 IEEE International Interconnect Technology Conference - IITC - Burlingame, CA, USA (2010.06.6-2010.06.9)] 2010 IEEE International Interconnect Technology Conference - Integration of 20nm half pitch single damascene copper trenches by spacer-defined double patterning (SDDP) on metal hard mask (MHM)

Siew, Yong Kong, Versluijs, Janko, Kunnen, Eddy, Ciofi, Ivan, Alaerts, Wilfried, Dekkers, Harold, Volders, Henny, Suhard, Samuel, Cockburn, Andrew, Sleeckx, Erik, Van Besien, Els, Struyf, Herbert, Mae

Year:

2010

Language:

english

File:

PDF, 887 KB

english, 2010

17

A tiered approach for the human health risk assessment for consumption of vegetables from with cadmium-contaminated land in urban areas

Swartjes, Frank A., Versluijs, Kees W., Otte, Piet F.

Journal:

Environmental Research

Year:

2013

Language:

english

File:

PDF, 431 KB

english, 2013

18

30-nm half-pitch metal patterning using Motif™ critical dimension shrink technique and double patterning

Versluijs, Janko

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Year:

2009

Language:

english

File:

PDF, 855 KB

english, 2009

19

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Advances in Resist Materials and Processing Technology XXIV - A novel plasma-assisted shrink process to enlarge process windows of narrow trenches and contacts for 45-nm node applications and beyond

Op de Beeck, Maaike, Lin, Qinghuang, Versluijs, Janko, Tőkei, Zsolt, Demuynck, Steven, De Marneffe, J.-F., Boullart, Werner, Vanhaelemeersch, Serge, Zhu, Helen, Cirigliano, Peter, Pavel, Elizabeth, Sa

Year:

2007

Language:

english

File:

PDF, 926 KB

english, 2007

20

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Advanced Etch Technology for Nanopatterning IV - A way to integrate multiple block layers for middle of line contact patterning

Lin, Qinghuang, Engelmann, Sebastian U., Zhang, Ying, Kunnen, E., Demuynck, S., Brouri, M., Boemmels, J., Versluijs, J., Ryckaert, J.

Year:

2015

Language:

english

File:

PDF, 832 KB

english, 2015

21

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Design for Manufacturability through Design-Process Integration - Double pattern EDA solutions for 32nm HP and beyond

Bailey, George E., Wong, Alfred K. K., Singh, Vivek K., Tritchkov, Alexander, Park, Jea-Woo, Hong, Le, Wiaux, Vincent, Hendrickx, Eric, Verhaegen, Staf, Xie, Peng, Versluijs, Janko

Year:

2007

Language:

english

File:

PDF, 1.24 MB

english, 2007

22

Low fitness at low latitudes: wintering in the tropics increases migratory delays and mortality rates in an arctic‐breeding shorebird

Reneerkens, Jeroen, Versluijs, Tom S.L., Piersma, Theunis, Alves, José A., Boorman, Mark, Corse, Colin, Gilg, Olivier, Hallgrimsson, Gunnar Thor, Lang, Johannes, Loos, Bob, Ntiamoa‐Baidu, Yaa, Nuoh, A

Journal:

Journal of Animal Ecology

Year:

2019

Language:

english

File:

PDF, 11.94 MB

english, 2019

23

Dielectric Reliability of 50 nm Half Pitch Structures in Aurora ® LK

Demuynck, Steven, Kim, Honggun, Huffman, Craig, Darnon, Maxime, Struyf, Herbert, Versluijs, Janko, Claes, Martine, Vereecke, Guy, Verdonck, Patrick, Volders, Henny, Heylen, Nancy, Kellens, Kristof, De

Journal:

Japanese Journal of Applied Physics

Year:

2009

Language:

english

File:

PDF, 400 KB

english, 2009

24

[IEEE 2019 IEEE 7th International Conference on Serious Games and Applications for Health (SeGAH) - Kyoto, Japan (2019.8.5-2019.8.7)] 2019 IEEE 7th International Conference on Serious Games and Applications for Health (SeGAH) - Care 4 Supply

Spil, Ton AM, Versluijs, Wouter, Vliegen, Ingrid

Year:

2019

Language:

english

File:

PDF, 1.84 MB

english, 2019

25

Key contributors for improvement of line width roughness, line edge roughness, and critical dimension uniformity: 15 nm half-pitch patterning with extreme ultraviolet and self-aligned double patterning

Xu, Kaidong, Souriau, Laurent, Hellin, David, Versluijs, Janko, Wong, Patrick, Vangoidsenhoven, Diziana, Vandenbroeck, Nadia, Dekkers, Harold, Shi, Xiaoping, Albert, Johan, Tan, Chi Lim, Vertommen, Jo

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Year:

2013

Language:

english

File:

PDF, 2.94 MB

english, 2013

26

Magnetotransport properties of Fe3O4 nanocontacts

J.J Versluijs, J.M.D Coey

Journal:

Journal of Magnetism and Magnetic Materials

Year:

2001

Language:

english

File:

PDF, 68 KB

english, 2001

27

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 27 February 2011)] Extreme Ultraviolet (EUV) Lithography II - Patterning challenges in setting up a 16nm node 6T-SRAM device using EUV lithography

Vandeweyer, Tom, La Fontaine, Bruno M., Naulleau, Patrick P., De Backer, Johan, Versluijs, Janko, Truffert, Vincent, Verhaegen, Staf, Ercken, Monique, Dusa, Mircea

Year:

2011

Language:

english

File:

PDF, 10.50 MB

english, 2011

28

The Preparation of Supported NiO and Co3O4 Nanoparticles by the Nitric Oxide Controlled Thermal Decomposition of Nitrates

Jelle R. A. Sietsma, Johannes D. Meeldijk, Johan P. den Breejen, Marjan Versluijs-Helder, A. Jos van Dillen, Petra E. de Jongh, Krijn P. de Jong

Journal:

Angewandte Chemie

Year:

2007

Language:

english

File:

PDF, 192 KB

english, 2007

29

Physicochemical Characterization of Porous Materials: Spatially Resolved Accessibility of Zeolite Crystals

Sander van Donk, Johannes H. Bitter, An Verberckmoes, Marjan Versluijs-Helder, Alfred Broersma, Krijn P. de Jong

Journal:

Angewandte Chemie International Edition

Year:

2005

Language:

english

File:

PDF, 109 KB

english, 2005

30

Effect of 3-aminobenzamide on antigenic variation of Trypanosoma brucei

A.W.C.A. Cornelissen, P.A.M. Michels, P. Borst, W. Spanjer, J.A.M. Versluijs-Broers, C. Van Der Meer, F. Farzaneh, S. Shall

Journal:

Biochemical Pharmacology

Year:

1985

Language:

english

File:

PDF, 645 KB

english, 1985

31

Variation in two Begonia × hiemalis clones after in vitro propagation

Westerhof, J., Hakkaart, F.A., Versluijs, Joke M.A.

Journal:

Scientia Horticulturae

Year:

1984

Language:

english

File:

PDF, 391 KB

english, 1984

32

Preparation of Control Blood for External Quality Assessment of Point-of-Care International Normalized Ratio Testing in the Netherlands

van den Besselaar, A. M. H. P., Abdoel, C. F., Ardanary, D., van de Kamp, G., Versluijs, F. A. C.

Journal:

American Journal of Clinical Pathology

Year:

2014

Language:

english

File:

PDF, 409 KB

english, 2014

33

VIRUSES OF ALSTROEMERIA AND PRELIMINARY RESULTS OF MERISTEM CULTURE

Hakkaart, F.A., Versluijs, J.M.A.

Journal:

Acta Horticulturae

Year:

1985

File:

PDF, 216 KB

1985

34

How nitric oxide affects the decomposition of supported nickel nitrate to arrive at highly dispersed catalysts

Jelle R.A. Sietsma, Heiner Friedrich, Alfred Broersma, Marjan Versluijs-Helder, A. Jos van Dillen, Petra E. de Jongh, Krijn P. de Jong

Journal:

Journal of Catalysis

Year:

2008

Language:

english

File:

PDF, 1.02 MB

english, 2008

35

Comparative effects of DDT, allethrin, dieldrin and aldrin-transdiol on sense organs of Xenopus laevis

L.M.A. Akkermans, J. van den Bercken, M. Versluijs-Helder

Journal:

Pesticide Biochemistry and Physiology

Year:

1975

Language:

english

File:

PDF, 493 KB

english, 1975

36

Shell decoration of hydrothermally obtained colloidal carbon spheres with base metal nanoparticles

Hoekstra, Jacco, Beale, Andrew M., Soulimani, Fouad, Versluijs-Helder, Marjan, Geus, John W., Jenneskens, Leonardus W.

Journal:

New Journal of Chemistry

Year:

2015

Language:

english

File:

PDF, 2.43 MB

english, 2015

37

Integration and Dielectric Reliability of 30 nm Half Pitch Structures in Aurora®LK HM

S. Demuynck, C. Huffman, M. Claes, S. Suhard, J. Versluijs, H. Volders, N. Heylen, K. Kellens, K. Croes, H. Struyf, G. Vereecke, P. Verdonck, D. De Roest, J. Beynet, H. Sprey, G. P. Beyer

Year:

2010

Language:

english

File:

PDF, 442 KB

english, 2010

38

[IEEE 2015 Symposium on VLSI Technology - Kyoto, Japan (2015.6.16-2015.6.18)] 2015 Symposium on VLSI Technology (VLSI Technology) - Gate-all-around NWFETs vs. triple-gate FinFETs: Junctionless vs. extensionless and conventional junction devices with controlled EWF modulation for multi-VT CMOS

Veloso, A., Hellings, G., Cho, M. J., Simoen, E., Devriendt, K., Paraschiv, V., Vecchio, E., Tao, Z., Versluijs, J. J., Souriau, L., Dekkers, H., Brus, S., Geypen, J., Lagrain, P., Bender, H., Eneman,

Year:

2015

Language:

english

File:

PDF, 624 KB

english, 2015

39

[IEEE 2017 IEEE International Interconnect Technology Conference (IITC) - HsinChu, Taiwan (2017.5.16-2017.5.18)] 2017 IEEE International Interconnect Technology Conference (IITC) - N5 technology node dual-damascene interconnects enabled using multi patterning

Briggs, B., Wilson, C. J., Devriendt, K., van der Veen, M. H., Decoster, S., Paolillo, S., Versluijs, J., Kesters, E., Sebaai, F., Jourdan, N., El-Mekki, Z., Heylen, N., Verdonck, P., Wan, Danny, Pedr

Year:

2017

Language:

english

File:

PDF, 587 KB

english, 2017

40

Ecological restoration for biodiversity conservation improves habitat quality for an insectivorous passerine in boreal forest

Versluijs, Martijn, Roberge, Jean-Michel, Eggers, Sönke, Boer, Jorina, Hjältén, Joakim

Journal:

Biological Conservation

Year:

2019

Language:

english

File:

PDF, 444 KB

english, 2019

41

[IEEE 2019 IEEE 7th International Conference on Serious Games and Applications for Health (SeGAH) - Kyoto, Japan (2019.8.5-2019.8.7)] 2019 IEEE 7th International Conference on Serious Games and Applications for Health (SeGAH) - Care 4 Supply

Spil, Ton AM, Versluijs, Wouter, Vliegen, Ingrid

Year:

2019

File:

PDF, 1.84 MB

2019

42

Carbon-Supported Base Metal Nanoparticles: Cellulose at Work

Hoekstra, Jacco, Versluijs-Helder, Marjan, Vlietstra, Edward J., Geus, John W., Jenneskens, Leonardus W.

Journal:

Year:

2015

Language:

english

File:

PDF, 1.02 MB

english, 2015

43

MP720DEDICATED GUIDANCE: MULTI-DIMENSIONAL COOPERATION LEADS TO MORE PRE-EMPTIVE KIDNEY TRANSPLANTATION

Scheuter - van Oers, Daènne, van Dongen, Dianne, Versluijs, Ellen, van Kooij, Ton, van der Marel, Tahnee, Boots, J MM, van den Dorpel, M A

Journal:

Nephrology Dialysis Transplantation

Year:

2016

Language:

english

File:

PDF, 58 KB

english, 2016

44

TLR3 agonists induce fibronectin aggregation by activated astrocytes: a role of pro-inflammatory cytokines and fibronectin splice variants

Werkman, Inge, Sikkema, Arend H., Versluijs, Joris B., Qin, Jing, de Boer, Pascal, Baron, Wia

Journal:

Scientific Reports

Year:

2020

Language:

english

File:

PDF, 4.98 MB

english, 2020

45

Spatially resolved UV–vis microspectroscopy on the preparation of alumina-supported Co Fischer–Tropsch catalysts: Linking activity to Co distribution and speciation

Leon G.A. van de Water, G. Leendert Bezemer, Jaap A. Bergwerff, Marjan Versluijs-Helder, Bert M. Weckhuysen, Krijn P. de Jong

Journal:

Journal of Catalysis

Year:

2006

Language:

english

File:

PDF, 563 KB

english, 2006

46

Habitat Selection of Brood-Rearing Northern Wheatears Oenanthe oenanthe and Their Invertebrate Prey

Oosten, H. Herman van, van den Burg, A.B., Versluijs, R., Siepel, H.

Journal:

Year:

2014

Language:

english

File:

PDF, 110 KB

english, 2014

47

Asymptomatic Adenovirus and Norovirus-PCR Positivity in the Stool Pre-Engraftment is a Predictor for Gastro-Intestinal GVHD

Lindemans, Caroline A., Berkelbach van der Sprenkel, Emma, Wolfs, Tom, Admiraal, Rick, Versluijs, A. Birgitta, Bierings, Marc, Wensing, Annemarie M., van Montfrans, Joris, Boelens, Jaap-Jan

Journal:

Biology of Blood and Marrow Transplantation

Year:

2016

Language:

english

File:

PDF, 129 KB

english, 2016

48

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2008)] Optical Microlithography XXI - 30nm half-pitch metal patterning using Moti CD shrink technique and double patterning

Versluijs, Janko, De Marneffe, J.-F., Goossens, Danny, Op de Beeck, Maaike, Vandeweyer, Tom, Wiaux, Vincent, Struyf, Herbert, Maenhoudt, Mireille, Brouri, Mohand, Vertommen, Johan, Kim, Ji Soo, Zhu, H

Year:

2008

Language:

english

File:

PDF, 916 KB

english, 2008

49

Excellent T-cell reconstitution and survival depend on low ATG exposure after pediatric cord blood transplantation

Admiraal, R., Lindemans, C. A., van Kesteren, C., Bierings, M. B., Versluijs, A. B., Nierkens, S., Boelens, J. J.

Journal:

Year:

2016

Language:

english

File:

PDF, 768 KB

english, 2016

50

The role of compliance as a cause of instability in oral anticoagulant therapy

Felix J. M. Van der Meer, Eenest BriëT, Jan P. Vandenbroucke, Dagmar I. ŠRámek, Myrthe H. P. M. Versluijs, Frits R. Rosendaal

Journal:

British Journal of Haematology

Year:

1997

Language:

english

File:

PDF, 477 KB

english, 1997

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